The PZ2100 source measure unit (SMU) from Keysight packs up to 20 precision source measure channels in 1U rack space to speed semiconductor characterization. This high-density test setup offers flexible software options, simplified system integration and synchronization, and application-specific measurement capabilities to help shorten time to market.
Scalable and compact, the PZ2100A mainframe provides 4 slots in a 1U full-width form factor that does not require cooling spacers when stacked. Five SMU module options cover a wide range of applications, from conventional static DC measurements down to 10 fA to emerging dynamic/pulsed measurements up to 15 Msamples/s and widths as narrow as 10 μs.
According to Keysight, a user-friendly GUI accelerates test prototyping, debugging, and troubleshooting, while PathWave IV Curve Measurement software enables quick measurements and synchronization without programming. By integrating pulser and digitizer functions with conventional SMU functions, the PZ2100 all-in-one modules allow digital development engineers to characterize the performance of an IC without additional instruments.
A configuration guide can be downloaded on the product page that provides step-by-step instructions to help configure a system to meet specific test requirements.
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